Collaborative Research: High-Speed AFM through Compressed Sensing

Sponsor: National Science Foundation

Award Number: 1234845

Abstract:

The primary research objective of this proposal is to improve the temporal resolution of atomic force microscopy (AFM) through non-raster sampling schemes based on compressed sensing (CS). While AFM continues to be used heavily for the study of systems with nanometer-scale features, its temporal resolution limits its applicability to the study of dynamics. The research approach progresses from non-raster sampling of a single image, including robust time-optimal control techniques to move the tip of the microscope as rapidly as possible between measurement locations, to CS driven schemes for acquisition of image sequences. The methods developed will be implemented and tested on AFMs to demonstrate their capabilities.

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